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Elevating wafer topography & defect control with advanced Metro-Spection technology.

Category:
  • Topographic Defects Inspection System
  • Metrology and Inspection
Locations:
  • Korea
  • China
  • Taiwan
  • Japan
  • Europe
  • US
  • SEA
Industry:
  • HBM
  • Memory (DRAM, NAND, 3D NAND)
  • Advanced Packaging
  • SOI
  • Power Semiconductor
  • Sensors (MEMS, Optoelectronics)
Brands:
  • UNITY-SC®

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