Fullsuite of metrology tools to enable real-time feedback.

Our competency

Intermolecular® has invested in a full suite of metrology tools to enable real-time feedback on deposited film characteristics.

Advanced structural, compositional, electrical and optical characterization can be performed on state-of-the art tools for a deep understanding of often complex and novel materials.


  • Profilometry X-ray Diffraction (XRD)
  • X-ray reflectivity (XRR)
  • Scanning Electron Microscope (SEM)
  • Atomic Force Microscopy (AFM)
  • Nano-indentation and scratch resistance


  • X-ray Photoelectron Spectroscopy (XPS)
  • X-ray Fluorescence (XRF)
  • Energy Dispersive X-ray Spectroscopy (EDS)


  • Sheet resistance
  • DC I-V/C-V
  • Pulse I-V
  • Polarization (P-V)


  • Internal photoemission (IPE)
  • Raman spectroscopy
  • Variable Angle Spectroscopic Ellipsometer (VASE)
  • Spectrophotometry
  • Fourier Transform Infrared Spectroscopy (FTIR)
  • Confocal Microscopy

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